BX620
HSBI (High Speed Memory Burn in Tester) is 200MHz / 400MBPS Memory Burn in Tester with 200MHz Pattern generator, Timing generator and Form factors integrated
It provides fail memory and redundancy analysis processor as optional
Test program development tool and data analysis tool are included
Support DDR4 / 5 DRAM, LPDDR, NAND Flash
200MHz Pattern Sequencer
Full Functionality Test
220A DPS per slot
C++ Based Test Program
-20℃ to +150℃, Flexible zone, -40℃option
2 Chamber 24 slots
Automation Ready